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SS1636LSTT Scheda tecnica(PDF) 2 Page - SEC Electronics Inc.

Il numero della parte SS1636LSTT
Spiegazioni elettronici  Unipolar Hall Switch-High sensitivity
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Produttore elettronici  SECELECTRONICS [SEC Electronics Inc.]
Homepage  http://www.secsemi.com
Logo SECELECTRONICS - SEC Electronics Inc.

SS1636LSTT Scheda tecnica(HTML) 2 Page - SEC Electronics Inc.

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SS1636
Unipolar Hall Switch-High sensitivity
2
V3.10
Nov 1, 2013
General Description
The SS1636 Hall effect sensor IC is fabricated from mixed signal CMOS technology. It incorporates advanced
chopper-stabilization techniques to provide accurate and stable magnetic switch points.
The circuit design provides an internally controlled clocking mechanism to cycle power to the Hall element and
analog signal processing circuits. This serves to place the high current-consuming portions of the circuit into a
“Sleep” mode. Periodically the device is “Awakened” by this internal logic and the magnetic flux from the Hall
element is evaluated against the predefined thresholds. If the flux density is above or below the Bop/Brp thresholds
then the output transistor is driven to change states accordingly. While in the “Sleep” cycle the output transistor is
latched in its previous state. The design has been optimized for service in applications requiring extended operating
lifetime in battery powered systems.
Pin Definitions and Descriptions
T
SOT Pin №
SIP Pin № Name
Type
Function
1
1
VDD
Supply
Supply Voltage pin
2
3
OUT
Output
Open Drain Output pin
3
2
GND
Ground
Ground pin
Absolute Maximum Ratings
Parameter
Symbol
Value
Units
Supply Voltage
VDD
5.5
V
Supply Current
IDD
70
μA
Output Voltage
VOUT
5.5
V
Output Current
IOUT
5
mA
Operating Temperature Range
TA
-40 to 150
°C
Storage Temperature Range
TS
-65 to 170
°C
ESD Sensitivity
4000
V
Operating Temperature Range
Symbol
Value
Units
Temperature Suffix “E”
TA
-40 to 85
°C
Temperature Suffix “K”
TA
-40 to 125
°C
Temperature Suffix “L”
TA
-40 to 150
°C
Exceeding the absolute maximum ratings may cause permanent damage. Exposure to absolute-maximum-rated conditions for extended
periods may affect device reliability.


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