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AD1981A Scheda tecnica(PDF) 5 Page - Analog Devices |
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AD1981A Scheda tecnica(HTML) 5 Page - Analog Devices |
5 / 24 page REV. 0 AD1981A –5– CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although the AD1981A features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. WARNING! ESD SENSITIVE DEVICE ORDERING GUIDE Temperature Package Package Model Range Description Option * AD1981AJST 0 °C to 70°C 48-Lead LQFP ST-48 *ST = Thin Quad Flatpack ABSOLUTE MAXIMUM RATINGS * (TA = 25 °C unless otherwise noted.) Power Supplies Digital (DVDD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +3.6 V Analog (AVDD) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +6.0 V Input Current (except Supply Pins) . . . . . . . . . . . . . . . ±10 mA Signals Pins Digital Input Voltage . . . . . . . . . . . . . –0.3 V to DVDD +0.3 V Analog Input Voltage . . . . . . . . . . . . –0.3 V to AVDD +0.3 V Ambient Temperature Range (Operating) . . . . . . . 0 °C to 70°C Ambient Temperature Rating (TQFP Package) TAMB = TCASE – ( PD CA ) TCASE = Case Temperature in °C PD = Power Dissipation in W JA Thermal Resistance (Junction-to-Ambient) . . . 76.2 °C/W JC Thermal Resistance (Junction-to-Case) . . . . . . . 17 °C/W JA Thermal Resistance (Case-to-Ambient) . . . . . 52.2 °C/W Storage Temperature Range . . . . . . . . . . . . –65 °C to +150°C *Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. |
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