3

2

4

5

1

OE

Y

A

GND

SN74AHC1G126-EP

www.ti.com

SCLS731 – DECEMBER 2013

SINGLE BUS BUFFER GATE WITH 3-STATE OUTPUT

Check for Samples: SN74AHC1G126-EP

1

FEATURES

•

Operating Range of 2 V to 5.5 V

•

DCK PACKAGE

(TOP VIEW)

•

Low Power Consumption, 10-

•

±8-mA Output Drive at 5 V

•

Latch-Up Performance Exceeds 250 mA Per

JESD 17

SUPPORTS DEFENSE, AEROSPACE,

AND MEDICAL APPLICATIONS

•

Controlled Baseline

•

One Assembly and Test Site

•

One Fabrication Site

•

Available in Military (–55°C to 125°C)

Temperature Range

•

Extended Product Life Cycle

•

Extended Product-Change Notification

•

Product Traceability

DESCRIPTION

The SN74AHC1G126 is a single bus buffer gate and line driver with 3-state output. The output is disabled when

the output-enable (OE) input is low. When OE is high, true data is passed from the A input to the Y output.

To ensure the high-impedance state during power up or power down, OE should be tied to GND through a

pulldown resistor; the minimum value of the resistor is determined by the current-sourcing capability of the driver.

ORDERABLE PART NUMBER

TOP-SIDE MARKING

VID NUMBER

–55°C to 125°C

SOT (SC-70) – DCK

Reel of 250

74AHC1G126MDCKTEP

SLI

V62/14605-01XE

(1)

For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI

web site at www.ti.com.

(2)

Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.

Table 1. FUNCTION TABLE

INPUTS

OUTPUT

OE

A

Y

H

H

H

H

L

L

L

X

Z

1

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

PRODUCTION DATA information is current as of publication date.

Copyright © 2013, Texas Instruments Incorporated

Products conform to specifications per the terms of the Texas

Instruments standard warranty. Production processing does not

necessarily include testing of all parameters.