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TAV-551 Scheda tecnica(PDF) 7 Page - Mini-Circuits |
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TAV-551 Scheda tecnica(HTML) 7 Page - Mini-Circuits |
7 / 13 page E-PHEMT TAV-551+ Notes A. Performance and quality attributes and conditions not expressly stated in this specification document are intended to be excluded and do not form a part of this specification document. B. Electrical specifications and performance data contained in this specification document are based on Mini-Circuit’s applicable established test performance criteria and measurement instructions. C. The parts covered by this specification document are subject to Mini-Circuits standard limited warranty and terms and conditions (collectively, “Standard Terms”); Purchasers of this part are entitled to the rights and benefits contained therein. For a full statement of the Standard Terms and the exclusive rights and remedies thereunder, please visit Mini-Circuits’ website at www.minicircuits.com/MCLStore/terms.jsp Mini-Circuits® www.minicircuits.com P.O. Box 350166, Brooklyn, NY 11235-0003 (718) 934-4500 sales@minicircuits.com Page 7 of 13 P1dB vs FREQUENCY & TEMPERATURE (1,4) @ VDS=4V, IDS=15mA 12 13 15 16 17 19 20 21 22 24 25 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 FREQUENCY (GHz) -45°C +25°C +85°C F Min vs FREQ @ VDS=3V (3) 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.5 6.0 FREQUENCY (GHz) 10 mA 15 mA 20 mA Notes: Noise parameters were measured over 0.5 to 6 GHz by Modelithics® using a solid state tuner-based NP noise parameter test system available from Maury Microwave. F Min, optimimum source reflection coefficient and noise resistance values are calculated values based on a set of measurements made at approximately 16 different impedances. Some data smoothing was applied to ar- rive at the presented data set. S-parameters were measured by Modelithics® on an Anritsu Lightning vector network analyzer over 0.1 to 18GHz using 350um pitch RF probes from GGB industries combined with customized thru-reflect-line (TRL) calibration standards. The reference plane is at the device package leads, as shown in the picture. Reference Plane Location for S and Noise Parameters (see data in pages 8-11) (Refer to Application Note AN-60-040) Fig 3. Reference Plane Location (1) Includes test board loss, set-up and conditions per Figure 1. (2) Measured using HP4155B semiconductor parameter analyzer. (3) F Min is minimum Noise Figure. (4) Drain current was allowed to increase during compression measurement. |
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