SN74AHC541, SN54AHC541

SCLS261O – OCTOBER 1995 – REVISED SEPTEMBER 2015

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6 Specifications

6.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)

(1)

MIN

MAX

UNIT

Supply voltage

–0.5

7

V

–0.5

7

V

–0.5

V

Input clamp current

–20

mA

Output clamp current

±20

mA

Continuous output current

±25

mA

±75

mA

Storage temperature

–65

150

°C

(1)

Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings

only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended

Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.

(2)

The input and output voltage ratings may be exceeded if the input and output current ratings are observed.

6.2 ESD Ratings

VALUE

UNIT

+1000

Electrostatic discharge

V

+2000

(1)

JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.

(2)

JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

6.3 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted)

(1)

SN54AHC541

SN74AHC541

UNIT

MIN

MAX

MIN

MAX

Supply voltage

2

5.5

2

5.5

V

1.5

1.5

High-level input voltage

2.1

2.1

V

3.85

3.85

0.5

0.5

Low-level Input voltage

0.9

0.9

V

1.65

1.65

Input voltage

0

5.5

0

5.5

V

Output voltage

0

0

V

–50

–50

µA

High-level output current

–4

–4

mA

–8

–8

50

50

µA

Low-level output current

4

4

mA

8

8

100

100

Δt/Δv

Input transition rise or fall rate

ns/V

20

20

Operating free-air temperature

–55

125

–40

125

°C

(1)

Implications of Slow or Floating CMOS Inputs (SCBA004).

4

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