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AM29BDS323DT11AWKI Scheda tecnica(PDF) 2 Page - Advanced Micro Devices |
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AM29BDS323DT11AWKI Scheda tecnica(HTML) 2 Page - Advanced Micro Devices |
2 / 44 page 2 Am29BDS323D P R E L I M INARY GENERAL DESCRIPTION The Am29BDS323 is a 32 Mbit, 1.8 Volt-only, simulta- neous Read/Write, Burst Mode Flash memory device, organized as 2,097,152 words of 16 bits each. This device uses a single VCC of 1.7 to 1.9 V to read, pro- gram, and erase the memory array. A 12.0-volt VPP may be used for faster program performance if desired. The device can also be programmed in standard EPROM programmers. The Am29BDS323 provides a burst access of 20 ns at 30 pF with initial access times of 120 ns at 30 pF. The device operates within the industrial temperature range of –40 °C to +85°C. The device is offered in the 47-ball FBGA package. Simultaneous Read/Write Operations with Zero Latency The Simultaneous Read/Write architecture provides simultaneous operation by dividing the memory space into two banks. The device can improve overall system performance by allowing a host system to pro- gram or erase in one bank, then immediately and si- multaneously read from the other bank, with zero latency. This releases the system from waiting for the completion of program or erase operations. The device is divided as shown in the following table: The device uses Chip Enable (CE#), Write Enable (WE#), Address Valid (AVD#) and Output Enable (OE#) to control asynchronous read and write opera- tions. For burst operations, the device additionally requires Power Saving (PS), Ready (RDY), and Clock (CLK). This implementation allows easy interface with minimal glue logic to a wide range of microproces- sors/microcontrollers for high performance read opera- tions. The device offers complete compatibility with the JEDEC 42.4 single-power-supply Flash command set standard. Commands are written to the command register using standard microprocessor write timings. Reading data out of the device is similar to reading from other Flash or EPROM devices. The host system can detect whether a program or erase operation is complete by using the device sta- tus bit DQ7 (Data# Polling) and DQ6/DQ2 (toggle bits). After a program or erase cycle has been com- pleted, the device automatically returns to reading array data. The sector erase architecture allows memory sec- tors to be erased and reprogrammed without affecting the data contents of other sectors. The device is fully erased when shipped from the factory. Hardware data protection measures include a low VCC detector that automatically inhibits write opera- tions during power transitions. The device also offers three types of data protection at the sector level. The sector lock/unlock command sequence disables or re-enables both program and erase operations in any sector. When at VIL, WP# locks the two outermost sec- tors. Finally, when VPP is at VIL, all sectors are locked. The device offers two power-saving features. When addresses have been stable for a specified amount of time, the device enters the automatic sleep mode. The system can also place the device into the standby mode. Power consumption is greatly re- duced in both modes. Bank A Sectors Bank B Sectors Quantity Size Quantity Size 8 4 Kwords 48 32 Kwords 15 32 Kwords 8 Mbits total 24 Mbits total |
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