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AD5246BKSZ100-R2 Scheda tecnica(PDF) 11 Page - Analog Devices |
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AD5246BKSZ100-R2 Scheda tecnica(HTML) 11 Page - Analog Devices |
11 / 16 page Data Sheet AD5246 Rev. C | Page 11 of 16 TEST CIRCUITS Figure 21 to Figure 25 define the test conditions used in the product Specification tables. IW VMS W B DUT Figure 21. Test Circuit for Resistor Position Nonlinearity Error (Rheostat Operation; R-INL, R-DNL) ∆V MS% DD% PSS (%/%) = V+ = VDD 10% PSRR (dB) = 20 LOG DUT MS DD ( ) VDD VMS W B V+ ∆V ∆V ∆V ± Figure 22. Test Circuit for Power Supply Sensitivity (PSS, PSSR) W 10k Ω 10k Ω 2.5V B +15V –15V VOUT OP27 DUT VIN Figure 23. Test Circuit for Gain vs. Frequency W B VDD TO GND DUT ISW CODE = 0x00 RSW = 0.1V ISW 0.1V Figure 24. Test Circuit for Incremental On Resistance W B NO CONNECT ICM VCM DUT Figure 25. Test Circuit for Common-Mode Leakage Current |
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