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ADM1069ACPZ Scheda tecnica(PDF) 6 Page - Analog Devices |
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ADM1069ACPZ Scheda tecnica(HTML) 6 Page - Analog Devices |
6 / 32 page ADM1069 Rev. C | Page 6 of 32 Parameter Min Typ Max Unit Test Conditions/Comments Standard (Digital Output) Mode (PDO1 to PDO8) VOH 2.4 V VPU (pull-up to VDDCAP or VPx) = 2.7 V, IOH = 0.5 mA 4.5 V VPU to VPx = 6.0 V, IOH = 0 mA VPU − 0.3 V VPU ≤ 2.7 V, IOH = 0.5 mA VOL 0 0.50 V IOL = 20 mA IOL2 20 mA Maximum sink current per PDOx pin ISINK2 60 mA Maximum total sink for all PDOx pins RPULL-UP 16 20 29 kΩ Internal pull-up ISOURCE (VPx)2 2 mA Current load on any VPx pull-ups, that is, total source current available through any number of PDO pull-up switches configured onto any one VPx pin Three-State Output Leakage Current 10 μA VPDO = 14.4 V Oscillator Frequency 90 100 110 kHz All on-chip time delays derived from this clock DIGITAL INPUTS (VXx, A0, A1) Input High Voltage, VIH 2.0 V Maximum VIN = 5.5 V Input Low Voltage, VIL 0.8 V Maximum VIN = 5.5 V Input High Current, IIH −1 μA VIN = 5.5 V Input Low Current, IIL 1 μA VIN = 0 V Input Capacitance 5 pF Programmable Pull-Down Current, IPULL-DOWN 20 μA VDDCAP = 4.75 V, TA = 25°C, if known logic state is required SERIAL BUS DIGITAL INPUTS (SDA, SCL) Input High Voltage, VIH 2.0 V Input Low Voltage, VIL 0.8 V Output Low Voltage, VOL2 0.4 V IOUT = −3.0 mA SERIAL BUS TIMING3 Clock Frequency, fSCLK 400 kHz Bus Free Time, tBUF 1.3 μs Start Setup Time, tSU;STA 0.6 μs Stop Setup Time, tSU;STO 0.6 μs Start Hold Time, tHD;STA 0.6 μs SCL Low Time, tLOW 1.3 μs SCL High Time, tHIGH 0.6 μs SCL, SDA Rise Time, tR 300 ns SCL, SDA Fall Time, tF 300 ns Data Setup Time, tSU;DAT 100 ns Data Hold Time, tHD;DAT 5 ns Input Low Current, IIL 1 μA VIN = 0 V SEQUENCING ENGINE TIMING State Change Time 10 μs 1 At least one of the VH, VPx pins must be ≥ 3.0 V to maintain the device supply on VDDCAP. 2 Specification is not production tested but is supported by characterization data at initial product release. 3 Timing specifications are guaranteed by design and supported by characterization data. |
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