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OP27GP Scheda tecnica(PDF) 11 Page - Analog Devices |
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OP27GP Scheda tecnica(HTML) 11 Page - Analog Devices |
11 / 16 page REV. A –11– OP27 OP12 OP27 D.U.T. 100k 4.3k 4.7 F 2k 24.3k VOLTAGE GAIN = 50,000 2.2 F 22 F 110k SCOPE 1 RIN = 1M 0.1 F 10 100k 0.1 F TPC 28. Voltage Noise Test Circuit (0.1 Hz to 10 Hz) LOAD RESISTANCE – 2.4 100 1k 10k 100k TA = 25 C VS = 15V 2.2 2.0 1.8 1.6 1.4 1.2 1.0 0.8 0.6 0.4 TPC 29. Open-Loop Voltage Gain vs. Load Resistance 1 SEC/DIV 120 80 40 0 –40 –90 –120 0.1Hz to 10Hz p-p NOISE TPC 30. Low-Frequency Noise APPLICATION INFORMATION OP27 series units may be inserted directly into 725 and OP07 sockets with or without removal of external compensation or nulling components. Additionally, the OP27 may be fitted to unnulled 741-type sockets; however, if conventional 741 nulling circuitry is in use, it should be modified or removed to ensure correct OP27 operation. OP27 offset voltage may be nulled to zero (or another desired setting) using a potentiometer (see Offset Nulling Circuit). The OP27 provides stable operation with load capacitances of up to 2000 pF and ±10 V swings; larger capacitances should be decoupled with a 50 Ω resistor inside the feedback loop. The OP27 is unity-gain stable. Thermoelectric voltages generated by dissimilar metals at the input terminal contacts can degrade the drift performance. Best operation will be obtained when both input contacts are main- tained at the same temperature. OFFSET VOLTAGE ADJUSTMENT The input offset voltage of the OP27 is trimmed at wafer level. However, if further adjustment of VOS is necessary, a 10 k Ω trim potentiometer can be used. TCVOS is not degraded (see Offset Nulling Circuit). Other potentiometer values from 1 k Ω to 1 MΩ can be used with a slight degradation (0.1 µV/°C to 0.2 µV/°C) of TCVOS. Trimming to a value other than zero creates a drift of approximately (VOS/300) µV/°C. For example, the change in TCVOS will be 0.33 µV/°C if VOS is adjusted to 100 µV. The offset voltage adjustment range with a 10 k Ω potentiometer is ±4 mV. If smaller adjustment range is required, the nulling sensitivity can be reduced by using a smaller pot in conjuction with fixed resistors. For example, the network below will have a ±280 µV adjustment range. 1 8 4.7k 4.7k 1k POT V+ Figure 2. NOISE MEASUREMENTS To measure the 80 nV peak-to-peak noise specification of the OP27 in the 0.1 Hz to 10 Hz range, the following precautions must be observed: 1. The device must be warmed up for at least five minutes. As shown in the warm-up drift curve, the offset voltage typically changes 4 µV due to increasing chip temperature after power-up. In the 10-second measurement interval, these temperature-induced effects can exceed tens-of- nanovolts. 2. For similar reasons, the device has to be well-shielded from air currents. Shielding minimizes thermocouple effects. FREQUENCY – Hz 140 1 TA = 25 C 120 100 80 60 40 20 0 10 100 1k 10k 100k 1M 10M 100M 160 POSITIVE SWING NEGATIVE SWING TPC 31. PSRR vs. Frequency |
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