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FQD6N50C Scheda tecnica(PDF) 5 Page - Fairchild Semiconductor |
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FQD6N50C Scheda tecnica(HTML) 5 Page - Fairchild Semiconductor |
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5 / 9 page  Rev. B 1, October 2008 ©200 8 Fairchild Semiconductor Corporation Gate Charge Test Circuit & Waveform Resistive Switching Test Circuit & Waveforms Unclamped Inductive Switching Test Circuit & Waveforms Charge VGS 10V Qg Qgs Qgd 3mA VGS DUT VDS 300nF 50KΩ 200nF 12V Same Type as DUT Charge VGS 10V Qg Qgs Qgd 3mA VGS DUT VDS 300nF 50KΩ 200nF 12V Same Type as DUT VGS VDS 10% 90% t d(on) t r t on t off t d(off) t f VDD 10V VDS RL DUT RG VGS VGS VDS 10% 90% t d(on) t r t on t off t d(off) t f VDD 10V VDS RL DUT RG VGS EAS =L IAS2 ---- 2 1 -------------------- BVDSS -VDD BVDSS VDD VDS BVDSS t p VDD IAS VDS (t) ID (t) Time 10V DUT RG L I D t p EAS =L IAS2 ---- 2 1 EAS =L IAS2 ---- 2 1 ---- 2 1 -------------------- BVDSS -VDD BVDSS VDD VDS BVDSS t p VDD IAS VDS (t) ID (t) Time 10V DUT RG LL I D I D t p |
Codice articolo simile - FQD6N50C_08 |
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Descrizione simile - FQD6N50C_08 |
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