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UC1707-SP Scheda tecnica(PDF) 2 Page - Texas Instruments |
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UC1707-SP Scheda tecnica(HTML) 2 Page - Texas Instruments |
2 / 15 page UC1707-SP SLUSAG0 – MARCH 2011 www.ti.com This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. BLOCK DIAGRAM ORDERING INFORMATION(1) TA PACKAGE(2) ORDERABLE PART NUMBER TOP-SIDE MARKING 5962-8761901VEA 5962-8761901VEA (J) CDIP 5962-8761903VEA 5962-8761903VEA –55°C to 125°C (W) CFP 5962-8761903VFA 5962-8761903VFA (FK) LCCC 5962-8761901V2A 5962-8761901V2A (1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI web site at www.ti.com. (2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging. 2 Submit Documentation Feedback © 2011, Texas Instruments Incorporated Product Folder Link(s): UC1707-SP |
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