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LC374100SM Scheda tecnica(PDF) 4 Page - Sanyo Semicon Device |
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LC374100SM Scheda tecnica(HTML) 4 Page - Sanyo Semicon Device |
4 / 4 page PS No. 5609-4/4 LC374100SM, ST Timing Chart This catalog provides information as of May, 1998. Specifications and information herein are subject to change without notice. s No products described or contained herein are intended for use in surgical implants, life-support systems, aerospace equipment, nuclear power control systems, vehicles, disaster/crime-prevention equipment and the like, the failure of which may directly or indirectly cause injury, death or property loss. s Anyone purchasing any products described or contained herein for an above-mentioned use shall: Accept full responsibility and indemnify and defend SANYO ELECTRIC CO., LTD., its affiliates, subsidiaries and distributors and all their officers and employees, jointly and severally, against any and all claims and litigation and all damages, cost and expenses associated with such use: Not impose any responsibility for any fault or negligence which may be cited in any such claim or litigation on SANYO ELECTRIC CO., LTD., its affiliates, subsidiaries and distributors or any of their officers and employees jointly or severally. s Information (including circuit diagrams and circuit parameters) herein is for example only; it is not guaranteed for volume production. SANYO believes information herein is accurate and reliable, but no guarantees are made or implied regarding its use or any infringements of intellectual property rights or other rights of third parties. System Design Notes These ICs adopt the ATD technique, in which operation starts when a change in either the CE or address inputs is detected. This means that the output data immediately after power is applied is invalid. When using these ICs as program memory for Z80 and similar microprocessors, applications must take into account the fact that valid data will not be output after power is first applied unless the value of either the CE or at least one of the address lines is changed after the power supply has stabilized. Another point due to the use of the ATD technique is that these ICs are sensitive to input noise. Do not apply voltages outside the allowable DC input levels for extended periods and do not apply input voltages with large noise components. AC Test Conditions Input pulse levels 0.4 to 2.8 V Input rise/fall time 5 ns Input timing level 1.5 V Output timing level 1.5 V Output load See Figure 1 Figure 1 Output Load |
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