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74HCT4851PW Scheda tecnica(PDF) 9 Page - NXP Semiconductors |
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74HCT4851PW Scheda tecnica(HTML) 9 Page - NXP Semiconductors |
9 / 20 page 74HC_HCT4851_2 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 02 — 2 September 2008 9 of 20 NXP Semiconductors 74HC4851; 74HCT4851 8-channel analog MUX/DEMUX with injection-current effect control (1) Channel is selected by S0, S1 and S2. Fig 6. Test circuit for measuring OFF-state leakage current Fig 7. Test circuit for measuring ON-state leakage current 001aaf878 VCC Z E Yn VIH VI GND VO IS IS 001aaf879 VCC E Yn Yn VIL Z selected channel(1) any disabled channel n.c. VO VI GND IS RON = VSW / ISW. (1) Channel is selected by S0, S1 and S2. VI(1) < GND or VI(1) > VCC. GND < VI(2) < VCC. Fig 8. Test circuit for measuring ON resistance Fig 9. Test circuit for injection current coupling 001aaf880 VCC Z E Yn VIL VI GND ISW VSW V 001aaf881 VCC E Yn Yn VIL VI(2) VI(1) Z any disabled channel selected channel(1) VI RS GND VO ISW |
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