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74HCT4852 Scheda tecnica(PDF) 9 Page - NXP Semiconductors |
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74HCT4852 Scheda tecnica(HTML) 9 Page - NXP Semiconductors |
9 / 20 page 74HC_HCT4852_3 © NXP B.V. 2008. All rights reserved. Product data sheet Rev. 03 — 2 September 2008 9 of 20 NXP Semiconductors 74HC4852; 74HCT4852 4-channel analog MUX/DEMUX with injection-current effect control (1) Channel is selected by S0 and S1. Fig 6. Test circuit for measuring OFF-state leakage current Fig 7. Test circuit for measuring ON-state leakage current IS 001aag098 IS VI VIH E nYn nZ VCC GND VO 001aag099 VO VIL E nYn nZ VCC GND IS VI nYn selected channel(1) any disabled channel n.c. RON = VSW / ISW. (1) Channel is selected by S0 and S1. VI(1) < GND or VI(1) > VCC. GND < VI(2) < VCC. Fig 8. Test circuit for measuring ON resistance Fig 9. Test circuit for injection current coupling 001aag100 VSW VI VIL E nYn nZ VCC GND ISW V 001aag101 VI RS VIL VI(1) VI(2) E nYn nZ VCC GND ISW nYn any disabled channel selected channel(1) VO |
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