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ST25C04B6TR Scheda tecnica(PDF) 2 Page - STMicroelectronics |
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ST25C04B6TR Scheda tecnica(HTML) 2 Page - STMicroelectronics |
2 / 16 page The ST24/25x04 are 4 Kbit electrically erasable programmable memories (EEPROM), organized as 2 blocks of 256 x8 bits. They are manufactured in STMicroelectronics’s Hi-Endurance Advanced CMOS technology which guarantees an endur- ance of one million erase/write cycles with a data retention of 40 years. Both Plastic Dual-in-Line and Plastic Small Outline packages are available. The memories are compatible with the I2C stand- ard, two wire serial interface which uses a bi-direc- tional data bus and serial clock. The memories carry a built-in 4 bit, unique device identification code (1010) corresponding to the I2C bus defini- tion. This is used together with 2 chip enable inputs (E2, E1) so that up to 4 x 4K devices may be attached to the I 2C bus and selected individually. The memories behave as a slave device in the I2C protocol with all memory operations synchronized by the serial clock. Read and write operations are initiated by a START condition generated by the bus master. The START condition is followed by a stream of 7 bits (identification code 1010), plus one read/write bit and terminated by an acknowledge bit. SDA VSS SCL MODE/WC E1 PRE VCC E2 AI00852E ST24x04 ST25x04 1 2 3 4 8 7 6 5 Figure 2A. DIP Pin Connections 1 AI01107E 2 3 4 8 7 6 5 SDA VSS SCL MODE/WC E1 PRE VCC E2 ST24x04 ST25x04 Figure 2B. SO Pin Connections DESCRIPTION (cont’d) Symbol Parameter Value Unit TA Ambient Operating Temperature –40 to 125 °C TSTG Storage Temperature –65 to 150 °C TLEAD Lead Temperature, Soldering (SO8 package) (PSDIP8 package) 40 sec 10 sec 215 260 °C VIO Input or Output Voltages –0.6 to 6.5 V VCC Supply Voltage –0.3 to 6.5 V VESD Electrostatic Discharge Voltage (Human Body model) (2) 4000 V Electrostatic Discharge Voltage (Machine model) (3) 500 V Notes: 1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality documents. 2. MIL-STD-883C, 3015.7 (100pF, 1500 Ω). 3. EIAJ IC-121 (Condition C) (200pF, 0 Ω). Table 2. Absolute Maximum Ratings (1) 2/16 ST24/25C04, ST24/25W04 |
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