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SN74ABT18504PMR Scheda tecnica(PDF) 1 Page - Texas Instruments |
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SN74ABT18504PMR Scheda tecnica(HTML) 1 Page - Texas Instruments |
1 / 34 page SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 Copyright © 1993, Texas Instruments Incorporated 1 • Members of the Texas Instruments SCOPE ™ Family of Testability Products • Members of the Texas Instruments Widebus ™ Family • Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture • UBT ™ (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode • Two Boundary-Scan Cells per I/O for Greater Flexibility • State-of-the-Art EPIC-ΙΙB ™ BiCMOS Design Significantly Reduces Power Dissipation • SCOPE ™ Instruction Set – IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, and P1149.1A CLAMP and HIGHZ – Parallel Signature Analysis at Inputs With Masking Option – Pseudo-Random Pattern Generation From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Device Identification – Even-Parity Opcodes • Packaged in 64-Pin Plastic Thin Quad Flat Pack Using 0.5-mm Center-to-Center Spacings and 68-Pin Ceramic Quad Flat Pack Using 25-mil Center-to-Center Spacings B5 B6 B7 GND B8 B9 B10 VCC NC B11 B12 B13 B14 GND B15 B16 B17 A4 A5 A6 GND A7 A8 A9 A10 NC VCC A11 A12 A13 GND A14 A15 A16 60 59 58 57 56 55 54 53 52 51 50 49 48 47 46 45 44 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 28 29 30 31 32 33 34 87 6 5 4 93 1 68 67 2 35 36 37 38 39 66 65 27 64 63 62 61 40 41 42 43 SN54ABT18504 . . . HV PACKAGE (TOP VIEW) NC – No internal connection SCOPE, Widebus, UBT, and EPIC- ΙΙB are trademarks of Texas Instruments Incorporated. UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. |
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