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M74HCT541M1R Scheda tecnica(PDF) 6 Page - STMicroelectronics |
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M74HCT541M1R Scheda tecnica(HTML) 6 Page - STMicroelectronics |
6 / 12 page TEST CIRCUIT ICC (Opr.) HCT540 AC ELECTRICAL CHARACTERISTICS (CL =50 pF, Input tr =tf =6 ns) Symbol Parameter Test Conditions Value Unit VCC (V) CL (pF) TA =25 oC 54HC and 74HC -40 to 85 oC 74HC -55 to 125 oC 54HC Min. Typ. Max. Min. Max. Min. Max. tTLH tTHL Output Transition Time 4.5 50 6 12 15 18 ns tPLH tPHL Propagation Delay Time (for HCT540) 4.5 50 12 20 25 30 ns 4.5 150 16 25 31 38 ns tPLH tPHL Propagation Delay Time (for HCT541) 4.5 50 14 23 29 35 ns 4.5 150 18 28 35 42 ns tPZL tPZH Output Enable Time 4.5 50 RL =1K Ω 18 30 38 45 ns 4.5 150 RL =1K Ω 22 34 43 51 ns tPLZ tPHZ Output Disable Time 4.5 50 RL =1K Ω 19 27 34 41 ns CIN Input Capacitance 5 10 10 10 pF CPD (*) Power Dissipation Capacitance 34 pF (*) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without load. (Refer to Test Circuit). Average operting current can be obtained by the following equation. ICC(opr) = CPD •VCC •fIN +ICC/8 (per gate) M54/M74HCT540/541 6/12 |
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