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AD590 Scheda tecnica(PDF) 5 Page - Intersil Corporation

Il numero della parte AD590
Spiegazioni elettronici  2-Wire, Current Output Temperature Transducer
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Produttore elettronici  INTERSIL [Intersil Corporation]
Homepage  http://www.intersil.com/cda/home
Logo INTERSIL - Intersil Corporation

AD590 Scheda tecnica(HTML) 5 Page - Intersil Corporation

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NOTES
1. Maximum errors over all ranges are guaranteed based on
the known behavior characteristic of the AD590.
2. For one-trim accuracy specifications, the 205oC span is
assumed to be trimmed at 25oC; for all other spans, it is
assumed that the device is trimmed at the midpoint.
3. For the 205oC span, it is assumed that the two-trim
temperatures are in the vicinity of 0oC and 140oC; for all
other spans, the specified trims are at the endpoints.
4. In precision applications, the actual errors encountered
are usually dependent upon sources of error which are
often overlooked in error budgets. These typically
include:
a. Trim error in the calibration technique used
b. Repeatability error
c. Long term drift errors
Trim Error is usually the largest error source. This error
arises from such causes as poor thermal coupling between
the device to be calibrated and the reference sensor; refer-
ence sensor errors; lack of adequate time for the device
being calibrated to settle to the final temperature; radically
different thermal resistances between the case and the sur-
roundings (RθCA) when trimming and when applying the
device.
Repeatability Errors arise from a strain hysteresis of the
package. The magnitude of this error is solely a function of
the magnitude of the temperature span over which the
device is used. For example, thermal shocks between 0oC
and 100oC involve extremely low hysteresis and result in
repeatability errors of less than
±0.05oC. When the thermal-
shock excursion is widened to -55oC to 150oC, the device
will typIcally exhibit a repeatability error of
±0.05oC (±0.10
guaranteed maximum).
Long Term Drift Errors are related to the average operat-
ing temperature and the magnitude of the thermal-shocks
experienced by the device. Extended use of the AD590 at
temperatures above 100oC typically results in long-term drift
of
±0.03oC per month; the guaranteed maximum is ±0.10oC
per month. Continuous operation at temperatures below
100oC induces no measurable drifts in the device. Besides
the effects of operating temperature, the severity of thermal
shocks incurred will also affect absolute stability. For
thermal-shock excursions less than 100oC, the drift is diffi-
cult to measure (<0.03oC). However, for 200oC excursions,
the device may drift by as much as
±0.10oC after twenty
such shocks. If severe, quick shocks are necessary in the
application of the device, realistic simulated life tests are rec-
ommended for a thorough evaluation of the error introduced
J Grade Maximum Errors (oC)
NUMBER OF
TRIMS
TEMPERATURE
SPAN (oC)
LOWEST TEMPERATURE IN SPAN (×oC)
-55
-25
0
255075
100
125
None
10
4.2
4.6
5.0
5.4
5.8
6.2
6.6
7.2
None
25
5.0
5.2
5.5
5.9
6.0
6.9
7.5
8.0
None
50
6.5
6.5
6.4
6.9
7.3
8.2
9.0
-
None
100
7.7
8.0
8.3
8.7
9.4
-
-
-
None
150
9.2
9.5
9.6
-----
None
205
10.0
-------
One
10
0.3
0.2
0.2
0.2
0.2
0.2
0.2
0.3
One
25
0.9
0.6
0.5
0.5
0.5
0.6
0.8
0.9
One
50
1.9
1.5
1.0
1.0
1.0
1.5
1.9
-
One
100
2.3
2.2
2.0
2.0
2.3
-
-
-
One
150
2.5
2.4
2.5
-----
One
205
3.0
-------
Two
10
0.1
(Note 10)
(Note 10)
(Note 10)
(Note 10)
(Note 10)
(Note 10)
0.1
Two
25
0.2
0.1
(Note 10)
(Note 10)
(Note 10)
(Note 10)
0.1
0.2
Two
50
0.4
0.2
0.1
(Note 10)
(Note 10)
0.1
0.2
(Note 10)
Two
100
0.7
0.5
0.3
0.7
1.0
-
-
-
Two
150
1.0
0.7
1.2
-----
Two
205
1.6
-------
NOTE:
10. Less than
±0.05oC.
AD590


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