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MC14520BCP Scheda tecnica(PDF) 1 Page - ON Semiconductor

Il numero della parte MC14520BCP
Spiegazioni elettronici  Dual Up Counters
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Produttore elettronici  ONSEMI [ON Semiconductor]
Homepage  http://www.onsemi.com
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© Semiconductor Components Industries, LLC, 2006
January, 2006 − Rev. 5
1
Publication Order Number:
MC14518B/D
MC14518B, MC14520B
Dual Up Counters
The MC14518B dual BCD counter and the MC14520B dual binary
counter are constructed with MOS P−channel and N−channel
enhancement mode devices in a single monolithic structure. Each
consists of two identical, independent, internally synchronous 4−stage
counters. The counter stages are type D flip−flops, with interchangeable
Clock and Enable lines for incrementing on either the positive−going or
negative−going transition as required when cascading multiple stages.
Each counter can be cleared by applying a high level on the Reset line.
In addition, the MC14518B will count out of all undefined states within
two clock periods. These complementary MOS up counters find
primary use in multi−stage synchronous or ripple counting applications
requiring low power dissipation and/or high noise immunity.
Features
Diode Protection on All Inputs
Supply Voltage Range = 3.0 Vdc to 18 Vdc
Internally Synchronous for High Internal and External Speeds
Logic Edge−Clocked Design — Incremented on Positive Transition
of Clock or Negative Transition on Enable
Capable of Driving Two Low−power TTL Loads or One Low−power
Schottky TTL Load Over the Rated Temperature Range
Pb−Free Packages are Available*
MAXIMUM RATINGS (Voltages Referenced to VSS) (Note 1.)
Symbol
Parameter
Value
Unit
VDD
DC Supply Voltage Range
− 0.5 to +18.0
V
Vin, Vout
Input or Output Voltage Range
(DC or Transient)
− 0.5 to VDD + 0.5
V
Iin, Iout
Input or Output Current
(DC or Transient) per Pin
±10
mA
PD
Power Dissipation,
per Package (Note 2.)
500
mW
TA
Operating Temperature Range
− 55 to +125
°C
Tstg
Storage Temperature Range
− 65 to +150
°C
TL
Lead Temperature
(8−Second Soldering)
260
°C
Maximum ratings are those values beyond which device damage can occur.
Maximum ratings applied to the device are individual stress limit values (not
normal operating conditions) and are not valid simultaneously. If these limits are
exceeded, device functional operation is not implied, damage may occur and
reliability may be affected.
1. Maximum Ratings are those values beyond which damage to the device
may occur.
2. Temperature Derating:
Plastic “P and D/DW” Packages: – 7.0 mW/
_C From 65_C To 125_C
This device contains protection circuitry to guard against damage due to high
static voltages or electric fields. However, precautions must be taken to avoid
applications of any voltage higher than maximum rated voltages to this
high−impedance circuit. For proper operation, Vin and Vout should be constrained
to the range VSS v (Vin or Vout) v VDD.
Unused inputs must always be tied to an appropriate logic voltage level (e.g.,
either VSS or VDD). Unused outputs must be left open.
http://onsemi.com
xx
= 18 or 20
A
= Assembly Location
WL, L
= Wafer Lot
YY, Y
= Year
WW, W
= Work Week
G
= Pb−Free Indicator
MARKING
DIAGRAMS
1
16
PDIP−16
P SUFFIX
CASE 648
MC145xxBCP
AWLYYWWG
SOIC−16
DW SUFFIX
CASE 751G
1
16
145xxB
AWLYYWWG
SOEIAJ−16
F SUFFIX
CASE 966
1
16
MC145xxB
ALYWG
See detailed ordering and shipping information in the package
dimensions section on page 7 of this data sheet.
ORDERING INFORMATION


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