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MC74AC245M Scheda tecnica(PDF) 4 Page - ON Semiconductor |
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MC74AC245M Scheda tecnica(HTML) 4 Page - ON Semiconductor |
4 / 10 page MC74AC245, MC74ACT245 http://onsemi.com 4 AC CHARACTERISTICS (For Figures and Waveforms − See AND8277/D at www.onsemi.com) Symbol Parameter VCC* (V) 74AC 74AC Unit Fig. No. TA = +25°C CL = 50 pF TA = −40°C to +85 °C CL = 50 pF Min Typ Max Min Max tPLH Propagation Delay 3.3 1.5 5.0 8.5 1.0 9.0 ns 3−5 An to Bn or Bn to An 5.0 1.5 3.5 6.5 1.0 7.0 tPHL Propagation Delay 3.3 1.5 5.0 8.5 1.0 9.0 ns 3−5 An to Bn or Bn to An 5.0 1.5 3.5 6.0 1.0 7.0 tPZH Output Enable Time 3.3 2.5 7.0 11.5 2.0 12.5 ns 3−7 5.0 1.5 5.0 8.5 1.0 9.0 tPZL Output Enable Time 3.3 2.5 7.5 12.0 2.0 13.5 ns 3−8 5.0 1.5 5.5 9.0 1.0 9.5 tPHZ Output Disable Time 3.3 2.0 6.5 12.0 1.0 12.5 ns 3−7 5.0 1.5 5.5 9.0 1.0 10.0 tPLZ Output Disable Time 3.3 2.0 7.0 11.5 1.5 13.0 ns 3−8 5.0 1.5 5.5 9.0 1.0 10.0 *Voltage Range 3.3 V is 3.3 V ±0.3 V. Voltage Range 5.0 V is 5.0 V ±0.5 V. DC CHARACTERISTICS Symbol Parameter VCC (V) 74ACT 74ACT Unit Conditions TA = +25°C TA = −40 °C to +85 °C Typ Guaranteed Limits VIH Minimum High Level Input Voltage 4.5 1.5 2.0 2.0 V VOUT = 0.1 V 5.5 1.5 2.0 2.0 or VCC − 0.1 V VIL Maximum Low Level Input Voltage 4.5 1.5 0.8 0.8 V VOUT = 0.1 V 5.5 1.5 0.8 0.8 or VCC − 0.1 V VOH Minimum High Level Output Voltage 4.5 4.49 4.4 4.4 V IOUT = −50 mA 5.5 5.49 5.4 5.4 *VIN = VIL or VIH 4.5 − 3.86 3.76 V IOH −24 mA 5.5 − 4.86 4.76 −24 mA VOL Maximum Low Level Output Voltage 4.5 0.001 0.1 0.1 V IOUT = 50 mA 5.5 0.001 0.1 0.1 *VIN = VIL or VIH 4.5 − 0.36 0.44 V IOL 24 mA 5.5 − 0.36 0.44 24 mA IIN Maximum Input Leakage Current 5.5 − ±0.1 ±1.0 mA VI = VCC, GND DICCT Additional Max. ICC/Input 5.5 0.6 − 1.5 mA VI = VCC − 2.1 V IOZT Maximum 3−State Current VI (OE) = VIL, VIH 5.5 − ±0.6 ±6.0 mA VI = VCC, GND VO = VCC, GND IOLD †Minimum Dynamic Output Current 5.5 − − 75 mA VOLD = 1.65 V Max IOHD 5.5 − − −75 mA VOHD = 3.85 V Min ICC Maximum Quiescent Supply Current 5.5 − 8.0 80.0 mA VIN = VCC or GND *All outputs loaded; thresholds on input associated with output under test. †Maximum test duration 2.0 ms, one output loaded at a time. |
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