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74FST3345QSR Scheda tecnica(PDF) 4 Page - ON Semiconductor

Il numero della parte 74FST3345QSR
Spiegazioni elettronici  10?묪it Low Power Bus Switch
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Produttore elettronici  ONSEMI [ON Semiconductor]
Homepage  http://www.onsemi.com
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74FST3345QSR Scheda tecnica(HTML) 4 Page - ON Semiconductor

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DC ELECTRICAL CHARACTERISTICS
Symbol
Parameter
Conditions
VCC
(V)
TA = *405C to )855C
Unit
Min
Typ*
Max
VIK
Clamp Diode Resistance
IIN = *18mA
4.5
*1.2
V
VIH
High−Level Input Voltage
4.0 to 5.5
2.0
V
VIL
Low−Level Input Voltage
4.0 to 5.5
0.8
V
II
Input Leakage Current
0 v VIN v 5.5 V
5.5
$1.0
mA
IOZ
OFF−STATE Leakage Current
0 v A, B v VCC
5.5
$1.0
mA
RON
Switch On Resistance (Note 6)
VIN = 0 V, IIN = 64 mA
4.5
4
7
W
VIN = 0 V, IIN = 30 mA
4.5
4
7
VIN = 2.4 V, IIN = 15 mA
4.5
8
15
VIN = 2.4 V, IIN = 15 mA
4.0
11
20
ICC
Quiescent Supply Current
VIN = VCC or GND, IOUT = 0
5.5
3
mA
DICC
Increase In ICC per Input
One input at 3.4 V, Other inputs at VCC or GND
5.5
2.5
mA
*Typical values are at VCC = 5.0 V and TA = 25°C.
6. Measured by the voltage drop between A and B pins at the indicated current through the switch. On resistance is determined by the lower
of the voltages on the two (A or B) pins.
AC ELECTRICAL CHARACTERISTICS
Symbol
Parameter
Conditions
TA = *405C to )855C
CL = 50 pF, RU = RD = 500 W
Unit
VCC = 4.5−5.5 V
VCC = 4.0 V
Min
Max
Min
Max
tPHL,
tPLH
Prop Delay Bus to Bus (Note 7)
VI = OPEN
0.25
0.25
ns
tPZH,
tPZL
Output Enable Time, IOE to Bus A, B
VI = OPEN for tPZH
1.0
5.7
6.2
ns
tPHZ,
tPLZ
Output Disable Time, IOE to Bus A, B
VI = OPEN for tPHZ
1.0
5.2
5.5
ns
7. This parameter is guaranteed by design but is not tested. The bus switch contributes no propagation delay other than the RC delay of the
typical On resistance of the switch and the 50 pF load capacitance, when driven by an ideal voltage source (zero output impedance).
CAPACITANCE (Note 8)
Symbol
Parameter
Conditions
Typ
Max
Unit
CIN
Control Pin Input Capacitance
VCC = 5.0 V
6
pF
CI/O
Port Input/Output Capacitance
VCC, OE = 5.0 V
13
pF
8. TA = )25°C, f = 1 MHz, Capacitance is characterized but not tested.


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