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CRD5376 Scheda tecnica(PDF) 42 Page - Cirrus Logic |
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CRD5376 Scheda tecnica(HTML) 42 Page - Cirrus Logic |
42 / 68 page CRD5376 42 DS612RD1 3.4.1 Test Select The Test Select control sets the type of analysis to be run on the collected data set. Control Description Time Domain Runs a min / max calculation on the collected data set and then plots sample data value vs. sample number. Histogram Runs a histogram calculation on the collected data set and then plots sample occur- rence vs. sample value. Only valid for noise data since sine wave data varys over too many codes to plot as a histogram. Signal FFT Runs an FFT on the collected data set and then plots frequency magnitude vs. fre- quency. Statistics are calculated using the largest frequency bin as a full-scale signal reference. Noise FFT Runs an FFT on the collected data set and then plots frequency magnitude vs. fre- quency. Statistics are calculated using a simulated full-scale signal as a full-scale sig- nal reference. Phase Runs an FFT on the collected data set and then plots phase vs. frequency. Limited usefulness for real collected data since noise has random phase. |
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Descrizione simile - CRD5376 |
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