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AM29BL802C70RZK Scheda tecnica(PDF) 4 Page - SPANSION |
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4 / 46 page 2 Am29BL802C 22371C7 November 3, 2006 D A TA SH EET GENERAL DESCRIPTION The Am29BL802C is an 8 Mbit, 3.0 Volt-only burst mode Flash memory devices organized as 524, 288 words. The device is offered in a 56-pin SSOP package. These devices are designed to be pro- grammed in-system with the standard system 3.0-volt VCC supply. A 12.0-volt VPP or 5.0 VCC is not required for program or erase operations. The device can also be programmed in standard EPROM programmers. The device offers access times of 65, 70, 90, and 120 ns, allowing high speed microprocessors to operate without wait states. To eliminate bus contention the device has separate chip enable (CE#), write enable (WE#) and output enable (OE#) controls. Burst Mode Features The Am29BL802C offers a Linear Burst mode—a 32 word sequential burst with wrap around—in a bottom boot configuration only. This devices require additional control pins for burst operations: Load Burst Address (LBA#), Burst Address Advance (BAA#), and Clock (CLK). This implementation allows easy interface with minimal glue logic to a wide range of microprocessors/microcontrollers for high perfor- mance read operations. AMD Flash Memory Features Each device requires only a single 3.0 volt power supply for both read and write functions. Internally generated and regulated voltages are provided for the program and erase operations. The I/O and control signals are 5V tolerant. The Am29BL802C is entirely command set compatible with the JEDEC single-power-supply Flash stan- dard. Commands are written to the command register using standard microprocessor write timings. Register contents serve as input to an internal state-machine that controls the erase and programming circuitry. Write cycles also internally latch addresses and data needed for the programming and erase operations. Reading data out of the device is similar to reading from other Flash or EPROM devices. Device erasure occurs by executing the erase com- mand sequence. This initiates the Embedded Erase algorithm—an internal algorithm that automatically preprograms the array (if it is not already programmed) before executing the erase operation. During erase, the device automatically times the erase pulse widths and verifies proper cell margin. The host system can detect whether a program or erase operation is complete by observing the RY/BY# pin, or by reading the DQ7 (Data# Polling) and DQ6 (toggle) status bits. After a program or erase cycle has been completed, the device is ready to read array data or accept another command. The sector erase architecture allows memory sectors to be erased and reprogrammed without affecting the data contents of other sectors. The device is fully erased when shipped from the factory. Hardware data protection measures include a low VCC detector that automatically inhibits write operations dur- ing power transitions. The hardware sector protection feature disables both program and erase operations in any combination of the sectors of memory. This can be achieved in-system or via programming equipment. The Erase Suspend/Erase Resume feature enables the user to put erase on hold for any period of time to read data from, or program data to, any sector that is not selected for erasure. True background erase can thus be achieved. The hardware RESET# pin terminates any operation in progress and resets the internal state machine to reading array data. The RESET# pin may be tied to the system reset circuitry. A system reset would thus also reset the device, enabling the system microprocessor to read the boot-up firmware from the Flash memory. The device offers two power-saving features. When ad- dresses have been stable for a specified amount of time, the device enters the automatic sleep mode. The system can also place the device into the standby mode. Power consumption is greatly reduced in both these modes. AMD’s Flash technology combines years of Flash memory manufacturing experience to produce the highest levels of quality, reliability and cost effectiveness. The device electrically erases all bits within a sector simultaneously via Fowler-Nordheim tunneling. The data is programmed using hot electron injection. |
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