Philips Semiconductors

Product specification

74ABT899

9-bit dual latch transceiver with 8-bit parity

generator/checker (3-State)

1998 Jan 16

5

PARITY AND ERROR FUNCTION TABLE

INPUTS

OUTPUTS

SEL

ODD/EVEN

xPAR

(A or B)

Σ of High

Inputs

xPAR

(B or A)

ERRt

ERRr*

PARITY MODES

H

H

H

Even

Odd

H

H

H

L

H

L

Odd

H

H

L

Even

Odd

L

L

L

H

L

H

Mode

Feed-through/check parity

H

L

H

Even

Odd

H

H

L

H

L

H

Even

H

L

L

Even

Odd

L

L

H

L

H

L

Mode

L

H

H

Even

Odd

H

L

H

L

H

H

Odd

L

H

L

Even

Odd

H

L

L

H

H

H

Mode

Generate parity

L

L

H

Even

Odd

L

H

L

H

H

H

Even

L

L

L

Even

Odd

L

H

H

L

H

H

Mode

H = High voltage level

L

= Low voltage level

t

= Transmit–if the data path is from A

→B then ERRt is ERRA

r

= Receive–if the data path is from A

→B then ERRr is ERRB

*

Blocked if latch is not transparent

SYMBOL

PARAMETER

CONDITIONS

RATING

UNIT

DC supply voltage

–0.5 to +7.0

V

DC input diode current

–18

mA

–1.2 to +7.0

V

DC output diode current

–50

mA

output in Off or High state

–0.5 to +5.5

V

DC output current

output in Low state

128

mA

Storage temperature range

–65 to 150

°C

NOTES:

1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the

device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to

absolute-maximum-rated conditions for extended periods may affect device reliability.

2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction

temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 1505C.

3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.