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Data Device Corporation
www.ddc-web.com
BU-65178/65179*/61688*/61689*
K-04/05-0
TABLE 1
1015 (note 1), 1030 (note 2)
BURN-IN
Notes:
1. For Process Requirement "B*" (refer to ordering information), devices may be non-compliant with MIL-
STD-883, Test Method 1015, Paragraph 3.2. Contact factory for details.
2. When applicable.
3000g
2001
CONSTANT ACCELERATION
C
1010
TEMPERATURE CYCLE
A and C
1014
SEAL
—
2009, 2010, 2017, and 2032
INSPECTION
CONDITION(S)
METHOD(S)
MIL-STD-883
TEST
STANDARD DDC PROCESSING
FOR HYBRID AND MONOLITHIC HERMETIC PRODUCTS